Resistive Switching in Stabilized Zirconia Films Studied by Conductive Atomic Force Microscopy
نویسندگان
چکیده
منابع مشابه
The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy
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ژورنال
عنوان ژورنال: Journal of Materials Science and Chemical Engineering
سال: 2017
ISSN: 2327-6045,2327-6053
DOI: 10.4236/msce.2017.51002